Feb 5 2003 Meeting

Free for paid-up CDMMS members, $5 for non-members. Refreshments will be served.

Historically, atom probes have been applied mostly to needle-shaped metal specimens by a small number of experts in the world. This is all changing. With our recent developments in Local Electrode Atom Probes (LEAP), three-dimensional (3D) atomic-scale compositional images may be obtained from planar specimens by non-experts. Furthermore, the data collection rates for three-dimensional images are over 100 times faster than current instruments. Typical images require minutes to acquire rather than days. The LEAP is also designed for ease of operation by non-experts. These developments suggest that these new atom probes can be applied to a wide range of materials including magnetic storage and semiconductor applications, metals, and possibly organic materials.

A professor of materials science and engineering in the UW-Madison College of Engineering until September 2001, Tom Kelly took a sabbatical and founded a company around the atom probe microscope-a technology that enables researchers to view and analyze materials such as computer chips at the atomic scale. His invention, the Local Electrode Atom Probe, or LEAP, uses a high electrical field to capture an atom-by-atom "picture" of a material and render that image on a computer screen in 3D.

Thomas F. Kelly received his Bachelor of Science in Mechanical Engineering with highest honors from Northeastern University in June 1977. He then entered graduate school at the Massachusetts Institute of Technology and received a Ph.D. in Materials Science in December 1981. After one year as a postdoctoral associate at M.I.T., he joined the faculty of the Department of Metallurgical and Mineral Engineering of the University of Wisconsin-Madison in January 1983. He was a Full Professor from 1994 until his departure from the renamed Department of Materials Science and Engineering. Tom was also Director of the Materials Science Center from 1992 to 1999.

Tom Kelly has been active in the fields of analytical electron microscopy, atom probe microscopy, rapidly solidified materials, and electronic and superconducting materials for over 25 years. He has published over 100 papers and 5 patents in these fields in that time. Dr. Kelly is an authority on microstructural characterization. He is expert in most forms of transmission electron microscopy, scanning electron microscopy, and atom probe microscopy and has brought innovations to the instrumentation and practice. Tom is currently Vice President of the International Field Emission Society and has just served a three year term as Director of the Microscopy Society of America.



		6300 Enterprise Lane, Madison, WI 53719
www.imago.com	tkelly@imago.com