Fran Adar, PhD
Horiba Jobin Yvon
Status of Raman Microscopy: Fast Mapping, Image Processing, UV to NIR Excitations, Near Field; Applications from Multiwell Plates to Nanotubes
A review of the concept and design of current state-of-the-art Raman microscopes will be presented. We are pushing the envelope in functionality in order to open new applications areas. Rapid mapping and sophisticated image processing is facilitating the extraction of information from images such as distribution of components and their relative abundance, and particle size distribution. In order to accommodate a variety of materials, instruments can work with laser wavelengths between 220 and 1064 nm by selecting appropriate optics, gratings, and detectors. High performance Raman microscopes are being used universally to study carbon nanotubes and other nanophase materials; required functionality includes high spectral dispersion, high spatial resolution and laser wavelength flexibility. The ability to measure the frequency of the radial breathing mode in CNT's provides a unique method of identification of tube type. Raman mapping in semiconductors using UV excitation is producing images of engineered strain in surface Si or SiGe layers with sub micrometer resolution. With the AFM we are hoping to achieve spatial resolution of the order of 100nm. Multiwell plates have been used for a number of years in the pharmaceutical industry to identify crystal polymorph and differentiate different salts. It is now being used to study small molecule libraries stored in solvents in wells. Time will be available to discuss the potential of Raman to study any areas of interest not included in the talk, but taking advantage of almost 30 years experience with Raman microscopy.
$5 for paid-up CDMMS members, $10 for non-members.
RSVP to Laurie LeTarte, letarte@crd.ge.com by September 11
For directions, here (Google map for 450 Duane Ave., Schenectady, NY)