Capital District Microscopy and Microanalysis Society

Early Fall Meeting

Thursday, September 25, 2007 at GE Global Research, Niskayuna, NY

6:00-7:00 PM buffet dinner; 7:00-8:00 PM talk by:

John Notte

MAS tour speaker, Senior Scientist, ALIS - Carl Zeiss SMT

An introduction to the Helium Ion Microscope

The performance of scanning electron microscopes (SEMs) andfocused ion beams (FIBs) has long been limited by the quality of thesource of the charged particles.  A new type of gas field ion source hasallowed us to make an easily focused beam of helium ions.  The heliumions can be used to image samples with higher resolution and bettercontrast mechanisms than SEMs or FIBs.  The extension of this technologyto heavier gases will permit operation like a traditional FIB butwithout gallium contamination.   This talk will provide an overview ofthis new technology and several applications.

$5 for students, $10 for paid-up CDMMS members, $15 for non-members.

For GE security purposes, pre-registration is required for this meeting.

Register with Laurie Le Tarte by September 25th by email, letarte@crd.ge.com or phone 

518-387-4041 


				

When registering, please provide Name, Phone number, Affiliation, and Citizenship.

You will need a government issued ID to enter GE.  No cameras are allowed.

For directions, see http://www.ge.com/research/grc_3_1.html