| Name |
Email |
Institution |
Interest |
| Anderson, Mark |
emer@emer.net |
RPI |
|
| Bajaj, Pooja |
pooja.bajaj@sabic-ip.com |
SABIC-IP |
|
| Behnke, David |
dbehnke@the-mandp-lab.com |
M&P Lab |
LM, SEM, microprobe, X-ray diffraction |
| Boyle, Edward |
boyle@jeol.com |
JEOL |
TEM, SEM, FIB, Sales Manager |
| Brandom, Robert |
robert.brandom@bruker-axs.com |
Bruker AXS |
MSA, MAS PLM, SEM, EDS, EMPA; |
| Burrell, Mike |
|
|
|
| Bush, Dave |
daveb@ixrfsystems.com |
IXRF Systems |
|
| Catrava, Palmyra |
catravap@union.edu |
Union |
Professor of Electrical Eng. |
| Cepler, Aron |
Acepler@uamail.albany.edu |
SUNY |
SEM, ESEM, Helium Ion Microscope, SPM |
| Chera, John |
cherajj@ge.com |
GE-GRC |
XPS, surface chemist |
| Cournoyer, Jim |
cournoye@ge.com |
GE-GRC |
SEM, FIB |
| Demarest, James |
jjdemar@us.ibm.com |
IBM-Albany NanoTech |
TEM, SEM, EDS, SPM, confocal LM |
| Denault, Lauraine |
denaultl@ge.com |
GE-GRC |
MSA, EDS, Field Emission SEM |
| Dovidenko, Katharine |
dovidenk@ge.com |
GE-GRC |
MSA TEM, EFTEM, EELS, EDX, SEM, EBSD, SEM, Nanoindentation |
| Dunn, Kathleen |
KDunn1@uamail.albany.edu |
CNSE-UA |
MSA, MAS TEM, SEM, FIB, metrology |
| Ellis, Dustin |
ellisdu@ge.com |
GE-GRC |
EM, FIB, nanoindentation |
| Flatoff, Daniel |
Daniel.Flatoff@globalfoundries.com |
Global Foundries |
|
| Foroughi, Joseph |
joeforo@hotmail.com |
M&P Lab |
MAS EPMA, LM, SEM, AFM |
| Frey, David |
freym2@rpi.edu |
RPI |
SEM, FIB, AFM |
| Fullam, Peter |
pdf@fullam.com |
E.F. Fullam, Inc. |
MSA Electron optical applications in materials science |
| Guise, Olivier |
olivier.guise@sabic-ip.com |
SABIC-IP |
SEM, EDX (Polymers) |
| Hakala, Christopher |
Christopher.Hakala@globalfoundries.com |
Global Foundries |
|
| Halabica, Andrej |
halaba@rpi.edu |
RPI |
|
| Hall, Ernest |
hallel@ge.com |
GE-GRC |
MSA, MAS |
| Huang, Jiang |
Jiang.Huang@globalfoundries.com |
Global Foundries |
|
| Johnston, Mark |
Mark.Johnston@globalfoundries.com |
Global Foundries |
|
| Kinnear, Glenn |
kinnear@oxford.usa.com |
Oxford Instruments |
|
| Lamanec, Tracy |
tlamanec@msn.com |
GE, M&P (retiree) |
EPMA, industrial materials |
| Le Tarte, Laurie |
letarte@ge.com |
GE-GRC |
SEM,EDX,u-XRF,AES,AFM |
| Lewis, Nathan |
lewisn@kapl.gov |
KAPL |
MSA TEM, microanalysis |
| Li, Juntao |
juntaoli@us.ibm.com |
IBM |
|
| Linsebigler, Amy |
linsebigle@ge.com |
GE-GRC |
SEM, FE Scanning, Auger |
| Maitland, Tim |
Tim.Maitland@fei.com |
FEI |
Sales manager, TEM, SEM |
| Marko, Mike |
marko@wadsworth.org |
Wadsworth Center |
MSA, MAS CTEM, IVEM, HVEM, EFTEM, EELS, STEM, EDS, FIB |
| Mazurkiewicz, Joseph |
MazurkJ@mail.amc.edu |
Albany Medical College |
|
| Mazuzan, Vanessa |
Vanessa.Mazuzan@fei.com |
FEI |
|
| McGee, Jim |
jmcgee@nycap.rr.com |
KAPL |
MSA, MAS SEM, EDS |
| Misner, Kathryn |
misnerk@ge.com |
GE-GRC |
|
| Moore, Richard |
rmoore@uamail.albany.edu |
CNSE-UA |
AES, XPS, materials science |
| Murray, Thomas |
TMurray@uamail.albany.edu |
CNSE-UA |
|
| Neander, Rosalyn |
neander@ge.com |
GE-GRC |
MSA, MAS, FESEM, AFM, TEM, ICP, OP, CWLS |
| O'Loughlin, Gerry |
goloughlin@10angstroms.com |
10 Angstroms Corporate |
E-beam lithography, SEM, nanomechanical testing and thin film deposition |
| Plesko, Eric |
plesko@netheaven.com |
KAPL |
Raman and IR microspectroscopy |
| Price, Richard |
rprice@phi.com |
Phi Corporate |
materials science, XPS |
| Priyadarshini, Deepika |
deepika.priyadarshini@gmail.com |
|
|
| Pyle, Joe |
josephpyle@gmail.com |
KAPL |
microprobe |
| Riccobono, Orrie |
riccobon@ge.com |
GE-GRC |
TEM, microtomy |
| Ridolfino, Mike |
|
Union |
|
| Riendeau, Jeffrey |
Jeffrey.Riendeau@globalfoundries.com |
Global Foundries |
Semiconductors, materials science, AES, XPS, SEM, EDS, WDS |
| Robertson, Craig |
robertson@ge.com |
GE-GRC |
SEM,ESEM,EDS |
| Rodriguez, Miguel |
mrodriguez@uamail.albany.edu |
CNSE-UA |
TEM, Instrumentation |
| Ruscitto, Dan |
ruscid2@rpi.edu |
RPI |
|
| Smentkowski, Vince |
smentkow@ge.com |
GE-GRC |
Surface analysis, ToF-SIMs |
| Sommerville, Robert |
rms@angstrom.us |
Angstrom Scientific Inc. |
|
| Spinelli, Ian |
spinelli@ge.com |
GE-GRC |
Biomaterials, Metallurgy, SEM, TEM, EDS, WDS, EBSD, Image Analysis |
| Sutliff, John |
sutlija@KAPL.gov |
JAS Scientific, KAPL |
MSA, MAS Materials Science: EM, Electron diffraction, minerologySIMS |
| Treadgold, John |
treadgold@smt.zeiss.com |
Carl Zeiss SMT |
TEM, SEM, Sales Manager |
| van den Boom, Ruud |
RvandenBoom@uamail.albany.edu |
GE-GRC |
SEM, FIB, SIMS, TEM |
| Ventrice, Carl |
Cventrice@uamail.albany.edu |
CNSE-UA |
|
| Wang, Xueqin |
Xueqin.Wang@globalfoundries.com |
Global Foundries |
|
| Wark, David |
wark@ge.com |
GE-GRC |
EPMA |
| Zhang, Lan |
Lan.Zhang@vistec-semi.com |
Vistec Lithography Inc. |
|
| Zonenberg, Andrew |
zonena@rpi.edu |
RPI |
Semiconductors, MEMS, LM, SEM, EDS |
| Zorn, Gilad |
zorn@ge.com |
GE-GRC |
ToF-SIMS |