Members

 

 
 

 
Name Email Institution Interest
Ajayan, Pulickel ajayan@mail.rpi.edu RPI HRTEM, carbon nanostructures
Barnard, Dave barnard@wadsworth.org Wadsworth Center HVEM, Instrumentation
Bartley, Kathleen* kbartley333@yahoo.com RPI  
Becker, Kiera beckek@mail.rpi.edu RPI  
Behnke, David dbehnke@the-mandp-lab.com M and P lab LM, SEM, microprobe, X-ray diffraction
Boyle, Edward boyle@jeol.com JEOL TEM, SEM, FIB, Sales Manager
Brandom, Robert robert.brandom@bruker-axs.com Bruker AXS MSA, MAS PLM, SEM, EDS, EMPA;  Bruker AXS Senior Sales Mgr.
Breslin, Chris      
Brown, Mike mbrown@umail.albany.edu SUNY - student e-beam lithography
Bunes, Benjamin benbunes@gmail.com Union Electrical Eng. Student
Callahan, Linda Linda_Callahan@urmc.rochester.edu U. Rochester Med. Center MSA Biomaterials, neuroscience
Catrava, Palmyra* catravap@union.edu Union Professor of Electrical Eng.
Charlie Nielsen nielsen@jeol.com JEOL SEM. Probe product manager
Chera, John cherajj@crd.ge.com GE CRD XPS, surface chemist
Christiana, Richard               chrislinus@hvi.net SUNY New Paltz  
Cross, Jason jcross@chroma.com Chroma Technology  
Davis, Andrew andrew@cameca.com Cameca Senior Account Mgr.
Demarest, James jjdemar@us.ibm.com IBM, Albany TEM, SEM, EDS, SPM, confocal LM
Denault, Lauraine denaultl@crd.ge.com GE CRD MSA, EDS, Field Emission SEM
Despa, Mircea despam@corning.com Corning Glass  
Dhar, Preeti                    dharp@newpaltz.edu SUNY New Paltz  
Domozych, David ddomoz@skidmore.edu Skidmore TEM, SEM, Botany
Dovidenko, Katharine dovidenk@research.ge.com GE GRD MSA TEM, EFTEM, EELS, EDX, SEM, EBSD, SEM, Nanoindentation
Dunn, Kathleen* KDunn1@uamail.albany.edu UA-CESTM MSA, MAS TEM, SEM, FIB, metrology
Ellis, Dustin ellisdu@crd.ge.com GE CRD EM, FIB, nanoindentation
Foroughi, Joseph* joeforo@hotmail.com M and P lab MAS EPMA,LM,SEM,AFM
Frey, David freym2@rpi.edu RPI SEM, FIB, AFM
Fullam, Peter pdf@fullam.com E.F. Fullam, Inc. MSA Electron optical applications in materials science
Grassucci, Robert bobg@wadsworth.org Wadsworth Center MSA Structural Biology, CryoTEM, image analysis
Guise, Oliver olivier.guise@ge.com GE Selkirk SEM, EDX (Polymers)
Hall, Ernest hallel@crd.ge.com GE CRD MSA, MAS
Han, Xiaodong han@hkltechnology.com HKL Technology TEM,HREM,EBSD,X-ray Structural-property relationships
Hanson, Michael LHanson1@nycap.rr.com KAPL Surface Science: ESCA, Auger microscopy, SIMS
Hare, Thomas* THare35667@aol.com Adirondack Environ. Svc. MSA Materials and environment
Harris-Jones, Jenah jharris-jones@uamail.albany.edu SUNY Nano scale sciences, student
Hatzistergos, Michael mhatzistergos@uamail.albany.edu UA-CESTM SEM, EDS
Heward, Will heward@crd.ge.com GE CRD  
Hooker, Mark hookerm@union.edu Union SEM
Hope, Lance lhope@superpower-inc.com Superpower  
Huber, Bill huber@crd.ge.com GE CRD SEM
Hugo, Al jhugo1@nycap.rr.com Hitachi High Technologies  
Irwin, Matt matt@electroimage.com ElectroImage, Inc.  
Izzard, Colin csizzard@albany.edu UA-Biology Light/confocal microscopy, cell biology
Jasso, Jerry jerry_jasso@tedpella.com Ted Pella TEM, SEM, Cryo TEM, vitrofication, microanalysis, IHC automation, LM
Johnson, Corbet CSJohnson@uamail.albany.edu UA-CESTM SEM/FIB/EDS. LM
Jordan, Cathy jordatt@aol.com KAPL Hi Res imaging, microanalysis
Kinnear, Glenn kinnear@oxford.usa.com Oxford  
Kramer, Dave kramerd@kapl.gov KAPL  
Kruk, Jennifer jennifer.kruk@gmail.com KAPL chemist
Lamanec, Tracy* elamanec@msn.com M and P lab EPMA, industrial materials
LeTarte, Laurie letarte@crd.ge.com GE CRD SEM,EDX,u-XRF,AES,AFM
Levine, Cathryn clevine@dcjs.state.ny.us NYS Forensic Science  
Levine, Ernest elevine@uamail.albany.edu UA-CESTM All
Lewis, Nathan* lewisn@kapl.gov KAPL MSA TEM, microanalysis
Li, Juntao jli@umail.albany.edu SUNY - student MSA electron and ion deposition, EELS
Lifshin, Eric elifshin@uamail.albany.edu UA-CESTM MAS All
Linsebigler, Amy linsebigle@crd.ge.com GE CRD SEM, FE Scanning, Auger
Lynne Tarnowski tarnowski@starfiresystems.com Starfire  
Maitland, Tim Tim.Maitland@fei.com FEI Sales manager, TEM, SEM
Marko, Mike* marko@wadsworth.org Wadsworth Center MSA, MAS CTEM, IVEM, HVEM, EFTEM, EELS, STEM, EDS, FIB
Matienzo, Luis Luis.Matienzo@eitny.com Endicott  
Mazurkiewicz, Joseph* mazurkj@mail.amc.edu AMC  
McGee, Jim* jmcgee@nycap.rr.com KAPL MSA, MAS SEM, EDS
Miller, Bill microbill@mohawk.net  
Moore, Richard* rmoore@uamail.albany.edu UA-CESTM AES, XPS, materials science
Morris, William morris@crd.ge.com GE CRD MAS
Mulford, Bob mulfor@kapl.gov KAPL  
Murray, Thomas*      
Neander, Rosalyn* neander@ge.com GE CRD MSA, MAS, FESEM, AFM, TEM, ICP, OP, CWLS
Nielsen, Charlie nielsen@jeol.com JEOL SEM, probe product manager
O'Connor, Michelle* moconnor11@nycap.rr.com KALP  
Oktyabrsky, Serge soktyabrsky@uamail.albany.edu UA-CESTM Solid State Structures, semiconductors
Ostrowski, Sara* ostrowski@crd.ge.com GE CRD ToF-SIMs, AFM, OP, CWLS
Othon, Michelle othon@crd.ge.com GE CRD SEM, EBSD
Pasternack, Dave David_Pasternack@urmc.rochester.edu U. Rochester Med. Center MSA Confocal. Light scattering
Pennington, Brett BrettL.Pennington@eitny.com Endicott  
Plesko, Eric* plesko@netheaven.com KAPL Raman and IR microspectroscopy
Price, Richard* rprice@phi.com Physical Electronics materials science, XPS
Pyle, Joe*   KAPL microprobe
Ramos, Frank FRamos@uamail.albany.edu UA-CESTM SIMS, AES
Rar, Andrei arar@superpower-inc.com Superpower Thin films, surfaces and microstructures charcterization
Reeves, Jodi jreeves@superpower-inc.com Superpower MSA, MAS SEM,FIB,TEM,XRD
Rice, Steve october1@earthlink.net KAPL TEM, Spectroscopy, materials
Riccobono, Orrie orrie.riccobono@ge.com GE CRD TEM, microtomy
Rickard, Christopher crickard@pica.army.mil Benet Lab  
Robertson, Craig* robertson@crd.ge.com GE CRD SEM,ESEM,EDS
Rodriguez, Miguel mrodriguez@uamail.albany.edu UA CESTM TEM, Instrumentation
Rullan, Jonathan jrullan@uamail.albany.edu UA-CESTM TEM, FIB, carbon nonotubes
Ryder, Sally ryder@crd.ge.com GE CRD SEM, EDS, EBIC, image analysis
Samsonoff, Bill samsonw@wadsworth.org Wadsworth Center MSA TEM, SEM, microbrial pathogenesis
Schneiders, Albert albert@iontofusa.com ION-TOF Applications Scientist
Sgammato, Bill bsgammato@thermonoran.com Thremo Noran Microanalysis
Shoemaker, Kevin kevins@the-mandp-lab.com M and P lab Photo microscopy, photo macrography, image analysis
Skelly Frame, Eileen Eileen_SkellyFrame@plugpower.com Plug Power SEM-EDS (analytical manager)
Smentkowski, Vince smentkow@crd.ge.com GE CRD Surface analysis, ToF-SIMs
Smith, George smithg@union.edu Union Cell Biology
Smith, Stephen sbsmith@pica.army.mil Benet Lab SEM
Sopok, Sam ssopok@pica.army.mil Benet Lab Metals and metal compounds
Spinelli, Ian* spinelli@ge.com GE R&D SEM, TEM, EDS, WDS, LM, materials scientist
Sutera, Karen ksutera@phi.com Physical Electronics Scanning Auger Nanoprobe, Scanning probe XPS, TOF-SIMS,
Sutliff, John john@jassci.com, sutlija@KAPL.gov JAS Scientific, KAPL MSA, MAS Materials Science: EM, Electron diffraction, minerologySIMS.
Tatiana Russell russell@starfiresystems.com Starfire  
Treadgold, John treadgold@smt.zeiss.com Carl Zeiss SMT TEM, SEM, Sales Manager
Turner, Jim turner@wadsworth.org Wadsworth Confocal LM, HVEM, nanofabrication
van den Boom, Ruud RvandenBoom@uamail.albany.edu GE CRD SEM, FIB, SIMS,TEM
Wark, David wark@research.ge.com GE CRD EPMA
Watkins, Vickie watkinv@crd.ge.com GE CRD Materials Science, Polymers
Webber, Jim webber@wadsworth.org Wadsworth Center TEM, EDS, Hazardous microparticles
Yang, Walter yang@kapl.gov KAPL TEM,EDS,EELS
 
 

* are current paid members