Robert Geer
The College of Nanoscale Science and Engineering of the University at Albany
Near-Field Scanning Spectroscopy: Spectroscopic imaging at the nanometer length scale
Optical spectroscopic imaging suffers from conventional optical resolution when probed using far field lenses. Exploiting the generation of surface plasmons from the surface of metallic nano or micro particles holds the potential to overcome these limitations. We present investigations of tip-enhanced Raman scattering for generation high-resolution Raman spectroscopic images from a strained Si test structure. The tip is mounted in a scanning probe microscope system and is used to generate nanoscale Raman maps of the test structure. We show that this approach enables surface specific spectroscopic imaging of the structure with significantly improved spatial resolution compared to conventional Raman microscopy.
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