Capital District Microscopy and Microanalysis Society

Spring Meeting

Tuesday, June 17, 2003

6:00-7:30PM

SuperPower, Inc., Schenectady, NY

Spectral Imaging: The Next Step in Microanalysis

Paul Kotula, Sandia National Laboratories

Made possible by the Microbeam Analysis Society Touring Speaker Program

All interested practitioners of microscopy and microanalysis are invited.

Food and beverages will be provided.

Free for CDMMS members, $5 for others.

Please RSVP to Jodi Reeves JReeves@IGC.com by June 13th.

For more details (abstract, biography, driving directions) see http://home.nycap.rr.com/cdmms/next.html



		See Paul's cover article: Kotula. P.G., Keenan, M.R., and Michael, J.R. (2003) Automated analysis of SEM X-ray spectral images. *Microscopy and Microanalysis* 9:1-17.